haddybhaiya/sem-i-con

An impactful project SEM -i-CON which does Defect Classification for Semiconductor Wafer/Die Images from Specialized Electron microscope (SEM) by developing an edge AI

语言：Jupyter Notebook · GitHub 星标：4 · Fork：0

话题：cnn · defect · defect-classification · edge-computing

在 GitHub 上查看原仓库